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Waveguide Optical Scanner with Increased Deflection Sensitivity for Optical Data Storage

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Abstract

Thin film electrooptic beam scanners [1,2] are of interest for applications such as optical recording and laser printing. We are pursuing a novel waveguide device structure in which prisms are formed by ferroelectric domain inversion in a substrate containing a planar waveguide. The device uses TM optical modes in z-cut substrates and is therefore compatible with waveguides used for optical second-harmonic generation (SHG).

© 1994 Optical Society of America

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