Effects of Raman amplification on measurement of nonlinear refractive index by the XPM method

Toshiaki Okuno; Yoshiyuki Suetsugu; Masayuki Nishimura

First Optoelectronics and Communications Conference
Technical Digest Series (Optica Publishing Group, 1996),
paper 17C2.4

Effects of Raman amplification on measurement of nonlinear refractive index by the XPM method

Toshiaki Okuno, Yoshiyuki Suetsugu, and Masayuki Nishimura

Optoelectronics and Communications Conference 1996

Chiba Japan
16–19 July 1996
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Fibers & Characterization (17C2)

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T. Okuno, Y. Suetsugu, and M. Nishimura, "Effects of Raman amplification on measurement of nonlinear refractive index by the XPM method," in First Optoelectronics and Communications Conference, Technical Digest Series (Optica Publishing Group, 1996), paper 17C2.4.

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Abstract

Effects of stimulated Raman scattering on the nonlinear refractive index measurement by the XPM method have been examined. Theoretical analysis and experiments have revealed, for the first time, that Raman effects are negligible.

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