Artifacts Sources In Interferometry

D. R. Eastman; C. A. Martin

doi:10.1364/OFT.1980.FFB3

Workshop on Optical Fabrication and Testing
Technical Digest Series (Optica Publishing Group, 1980),
paper FFB3
•https://doi.org/10.1364/OFT.1980.FFB3

Artifacts Sources In Interferometry

D. R. Eastman and C. A. Martin

Optical Fabrication and Testing 1980

Oakland, California United States
4–6 June 1980
ISBN:

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Optical Testing Technology (FFB)

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D. R. Eastman and C. A. Martin, "Artifacts Sources In Interferometry," in Workshop on Optical Fabrication and Testing, Technical Digest Series (Optica Publishing Group, 1980), paper FFB3.

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Abstract

Spurious interference effects in interferograms are investigated. These artifacts are caused by ghost reflections, dirt, and diffraction effects. Diagnosis and cures are discussed.

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