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Conferences > OFT > 1990 > OThC > OThC3

Microstructure Characterization by Angle-Resolved Scatter and Comparison to Measurements Made by Other Techniques

R. D. Jacobson, S. R. Wilson, G. A. Al-Jumaily, J. R. McNeil, Jean M. Bennett, and Lars Mattsson

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Abstract

In many areas of technology it is becoming increasingly important to characterize the microstructure of smooth surfaces. In the optics industry, which has long been concerned with optical scatter and related microstructure of components, the requirements for better, lower scatter materials and components are becoming more demanding as optical systems evolve. For example, high-energy laser optics and laser gyro mirrors require components which are state-of-the-art, with extremely low scatter from surfaces of < 2 Å rms roughness.

© 1990 Optical Society of America

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