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Merit Functions for More Effective Thin Film Calculations

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Abstract

At times multilayer coatings are required with properties that are a complicated function of the spectral transmittance or reflectance curve. We have modified our thin film synthesis program FILTER1to accept merit functions of the following type: where and In the above GiT, Giare the target and calculated quantities that are equal to or are functions of up to 3 different integrals Ijof the form and δGiare the acceptable tolerances on GiT. Wiis a weight factor provided in the input.

© 1988 Optical Society of America

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