Topographic Evaluation of Optical Thin Films by Hologram Interferometry

David Salazar; Diana Tentori

doi:10.1364/OIC.1988.TuA11

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1988),
paper TuA11
•https://doi.org/10.1364/OIC.1988.TuA11

Topographic Evaluation of Optical Thin Films by Hologram Interferometry

David Salazar and Diana Tentori

Optical Interference Coatings 1988

Tucson, Arizona United States
12–15 April 1988
ISBN:

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Characterization, Microstructure and Scattering (TuA)

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D. Salazar and D. Tentori, "Topographic Evaluation of Optical Thin Films by Hologram Interferometry," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1988), paper TuA11.

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Abstract

Interferometry is a very powerful technique since it allows us to obtain a two dimensional mapping of the optical path distribution across the field of observation.

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