Scattering Study of Single Layer Titania Films

C. Hickey; C. Amra; E. Pelletier

doi:10.1364/OIC.1988.TuA17

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1988),
paper TuA17
•https://doi.org/10.1364/OIC.1988.TuA17

Scattering Study of Single Layer Titania Films

C. Hickey, C. Amra, and E. Pelletier

Optical Interference Coatings 1988

Tucson, Arizona United States
12–15 April 1988
ISBN:

From the session
Characterization, Microstructure and Scattering (TuA)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
C. Hickey, C. Amra, and E. Pelletier, "Scattering Study of Single Layer Titania Films," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1988), paper TuA17.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

Light scattering measurements further characterize a series of TiO2 thin film samples. Previous analyses were given at the 1986 and 1987 O.S.A. annual meetings.

PDF Article

More Like This

Measurements of absorption losses in TIO2 films by a collinear photothermal deflection technique

M. Commandre and E. Pelletier
THV5 OSA Annual Meeting (FIO) 1988

Characterization Of Thin-Film Surfaces By Differential Scattering Measurements And Digital Analysis Of Replicas' Micrographs*

Lu zhong-Liang and Tang Jin-Fa
TuA12 Optical Interference Coatings (OIC) 1988

Physical microstructure of evaporated titania-silica and zirconia-silica multilayer thin films

P. Swab and R. E. Klinger
THV1 OSA Annual Meeting (FIO) 1985

Previous Article Next Article