Abstract

Ellipsometry is a powerful technique for the experimental determination of optical constants of thin film materials. In this paper, a novel technique for accurate measurement of magneto-optic effects of the transverse Kerr effect is described. For thin film applications, magneto-optic effects manifest themselves as first order perturbations, making it difficult to accurately determine the magneto-optic constants of a given material.

© 1988 Optical Society of America