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The Dependence of Optical and Spectral Properties of Thin-Layer Interference Structures on the Angle of Incidence of Plane Wave

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Abstract

In the previous research of Thin-layer Interference Structures (TIS) only the normal incidence of the electromagnetic wave on the structures under consideration was studied [1,2]. However, in practice we often meet with oblique incidence of the waves on stratified structures. So in this paper we have studied the dependence of optical and spectral properties of TIS on the angle of incidence of plane wave. This analysis is based on following assumptions: 1. The medium, from which the wave is falling, is homogenous and half infinite. 2. The layers of antireflection coating are homogenous and bounded only in the direction, which is perpendicular to the plane of the structure. 3. The wave is plane and monochromatic. 4. The losses in layers are supposed to be absent.

© 1995 Optical Society of America

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