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Under Thin-layer Interference Structures (TIS) [1,2] we'll understand antireflection systems with specific optical and structural properties, to the fundamental of which we can attribute the invariance of amplitude characteristics and total optical thickness of the structure on the number of periods and an opportunity of synthesis of such antireflection structures with layers' thicknesses significantly smaller than λ/4.
© 1995 Optical Society of America
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