Relaxation time of light induced refractive index modifications in dielectric thin films

S. Monneret; F. Flory; H. Rigneault

doi:10.1364/OIC.1995.ThA13

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1995),
paper ThA13
•https://doi.org/10.1364/OIC.1995.ThA13

Relaxation time of light induced refractive index modifications in dielectric thin films

S. Monneret, F. Flory, and H. Rigneault

Optical Interference Coatings 1995

Tucson, Arizona United States
5–9 June 1995
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Materials: 1 (ThA)

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S. Monneret, F. Flory, and H. Rigneault, "Relaxation time of light induced refractive index modifications in dielectric thin films," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1995), paper ThA13.

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Abstract

The totally reflecting prism coupler has been used for many years to determine refractive indices, thicknesses, or anisotropy of thin films [1]. It also enables us to study reversible disturbances of the optical properties of films materials with the temperature [2] or with the light beam power [3].

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