Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > OIC > 1995 > ThA > ThA7

Surface roughness characterisation of Au thin film by Spectroscopic Ellipsometry, Grazing x-ray reflectance and Scanning Tunnelling microscopy

Pierre Boher, Jean Louis Stehle, and Philippe Houdy

Not Accessible

Your library or personal account may give you access

Abstract

Gold thin films of various thicknesses have been evaporated on silicon and aluminium nitride substrates in the same conditions in order to test the substrate influence on the surface roughness and physical properties of the films.

© 1995 Optical Society of America

PDF Article
More Like This
SOFT X-RAY REFLECTANCE AND SURFACE ROUGHNESS OF VAPOR DEPOSITED THIN FILMS

M. Yanagihara, T. Sasaki, M. Furudate, and M. Yamamoto
WB.1 Physics of X-Ray Multilayer Structures (PXRAYMS) 1994

In Situ Growth Studies of Nanometer Thin-film Multilayers using Grazing X-ray Reflectivity and Ellipsometry

Eike Lüken, Eric Ziegler, Peter Høghøj, Andreas Freund, Erich Gerdau, and Alain Fontaine
MB.3 Physics of X-Ray Multilayer Structures (PXRAYMS) 1994

Effect of Surface Roughness on SHG Efficiency in Optical Thin Film Waveguides

Florence Armani-Leplingard, David K. Fork, and John J. Kingston
SD1 Advanced Solid State Lasers (ASSL) 1995

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use