Characterization of transparent thin films homogeneity with an ellipsometer in reflection for optic and mechanic applications

A. Guediche; O. Guillot; M. Lafarie; A. Moiny; H. Piombini

doi:10.1364/OIC.2022.TEA.5

Optical Interference Coatings Conference (OIC) 2022
Technical Digest Series (Optica Publishing Group, 2022),
paper TEA.5
•https://doi.org/10.1364/OIC.2022.TEA.5

Characterization of transparent thin films homogeneity with an ellipsometer in reflection for optic and mechanic applications

A. Guediche, O. Guillot, M. Lafarie, A. Moiny, and H. Piombini

Optical Interference Coatings 2022

Whistler, British Columbia Canada
19–24 June 2022
ISBN: 978-1-957171-04-3

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A. Guediche, O. Guillot, M. Lafarie, A. Moiny, and H. Piombini, "Characterization of transparent thin films homogeneity with an ellipsometer in reflection for optic and mechanic applications," in Optical Interference Coatings Conference (OIC) 2022, R. Sargent and A. Sytchkova, eds., Technical Digest Series (Optica Publishing Group, 2022), paper TEA.5.

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Abstract

To characterize the heterogeneity thickness of thin films responsible of modifications of the wave surface, an ellipsometer at 633 nm was developed. These films are designed to improve the lifetime of the Megajoule laser (LMJ).

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