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NIST Optical Properties of Materials Capabilities

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Abstract

The development of thin-film optics requires tools to interrogate their optical properties. This paper summarizes the National Institutes of Standards and Technology’s capabilities for measuring the optical properties of materials.

© 2022 The Author(s)

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More Like This
NIST Optoelectronic Measurements for Fiber Optic Applications

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OTuB5 Optical Fiber Communication Conference (OFC) 2005

Progress with the XCALIBIR interferometer at NIST

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WJ4 Frontiers in Optics (FiO) 2003

Metrology for Micro-Optics at NIST with µXCALIBIR

Quandou Wang, Ulf Griesmann, and Robert S. Polvani
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