Abstract

Recent developments in smart pixel device fabrication has enabled researchers to design and develop optoelectronic systems that utilize the parallelism and connectivity of optics with electronic control and processing. It is necessary for users of these devices to have the capability of testing the components at various stages of the development. In particular, the AT&T/ARPA CO-OP FET-SEED platform has enabled groups in the community such as ourselves to work on our own smart pixel device designs in a co-operative workshop [1,2]. We have developed and are using a custom optical and electronic probe station for the testing of smart pixel devices. The test station allows us to input and extract optical and electronic signals from the various parts of the smart pixels in order to characterize their behavior and performance. This feedback is essential for device and system development.

© 1995 Optical Society of America