Examination of Electric Fields in Ferroelectrics by Impact Ionization

Timothy A. Rost; Thomas A. Rabson

doi:10.1364/PMED.1990.BP4

Topical Meeting on Photorefractive Materials, Effects, and Devices II
Technical Digest Series (Optica Publishing Group, 1990),
paper BP4
•https://doi.org/10.1364/PMED.1990.BP4

Examination of Electric Fields in Ferroelectrics by Impact Ionization

Timothy A. Rost and Thomas A. Rabson

Photorefractive Materials, Effects, and Devices II 1990

Aussois France
17–19 January 1990
ISBN:

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T. A. Rost and T. A. Rabson, "Examination of Electric Fields in Ferroelectrics by Impact Ionization," in Topical Meeting on Photorefractive Materials, Effects, and Devices II, Technical Digest Series (Optica Publishing Group, 1990), paper BP4.

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Abstract

The space charge fields present in ferroelectric thin films are examined with impact ionization. The possibility of using this technique as a probe to aid in the understanding of the bulk photovoltaic effect is discussed.

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