Phase conjugate interferometric measurement of thin film parameters

M. Cronin-Golomb; J. Shamir

doi:10.1364/PMED.1990.JP3

Topical Meeting on Photorefractive Materials, Effects, and Devices II
Technical Digest Series (Optica Publishing Group, 1990),
paper JP3
•https://doi.org/10.1364/PMED.1990.JP3

Phase conjugate interferometric measurement of thin film parameters

M. Cronin-Golomb and J. Shamir

Photorefractive Materials, Effects, and Devices II 1990

Aussois France
17–19 January 1990
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Beam coupling Applications (JP)

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M. Cronin-Golomb and J. Shamir, "Phase conjugate interferometric measurement of thin film parameters," in Topical Meeting on Photorefractive Materials, Effects, and Devices II, Technical Digest Series (Optica Publishing Group, 1990), paper JP3.

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Abstract

We describe here a self-aligning interferometric device for the measurement of the thickness, refractive index and absorption coefficient of optical thin films.

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