An Imaging Method for Non Linear Medium Characteristic Measurements

G. Boudebs; X. Nguyen Phu; J.P. Lecoq; M. Sylla; G. Rivoire

doi:10.1364/PMED.1991.TuA1

Photorefractive Materials, Effects, and Devices
Technical Digest Series (Optica Publishing Group, 1991),
paper TuA1
•https://doi.org/10.1364/PMED.1991.TuA1

An Imaging Method for Non Linear Medium Characteristic Measurements

G. Boudebs, X. Nguyen Phu, J.P. Lecoq, M. Sylla, and G. Rivoire

Photorefractive Materials, Effects, and Devices II 1991

Beverly, Massachusetts United States
29–31 July 1991
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Materials and Diagnostics (TuA)

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G. Boudebs, X. N. Phu, J. P. Lecoq, M. Sylla, and G. Rivoire, "An Imaging Method for Non Linear Medium Characteristic Measurements," in Photorefractive Materials, Effects, and Devices, Technical Digest Series (Optica Publishing Group, 1991), paper TuA1.

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Abstract

A non linear medium is placed in the focal plane of a 4f set up (fig.1). The Fourier spectrum S(u) induces phase and amplitude changes inside the material [1].

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