Stability of Multilayers for Short-Wavelength Optics*

E. Ziegler; Y. Lepetre; Ivan K. Schuller; J. Viccaro; E. Spiller

doi:10.1364/SWCR.1986.MD2

Topical Meeting on Short Wavelength Radiation: Generation and Applications
Technical Digest Series (Optica Publishing Group, 1986),
paper MD2
•https://doi.org/10.1364/SWCR.1986.MD2

Stability of Multilayers for Short-Wavelength Optics^*

E. Ziegler, Y. Lepetre, Ivan K. Schuller, J. Viccaro, and E. Spiller

Short Wavelength Coherent Radiation: Generation and Applications 1986

Monterey, California United States
24–26 March 1986
ISBN:

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X-Ray Optics (MD)

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E. Ziegler, Y. Lepetre, I. K. Schuller, J. Viccaro, and E. Spiller, "Stability of Multilayers for Short-Wavelength Optics*," in Topical Meeting on Short Wavelength Radiation: Generation and Applications, Technical Digest Series (Optica Publishing Group, 1986), paper MD2.

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Abstract

A variety of multilayer mirrors with transition metal absorber layers (W-C, WRe-C, Co-C, and Cr-C) have been fabricated and tested up to 1000 C using standard θ-2θ x-ray diffraction, Debye-Scherrer scattering and microcleavage transmission electron microscopy.

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