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  • Topical Meeting on Short Wavelength Radiation: Generation and Applications
  • Technical Digest Series (Optica Publishing Group, 1986),
  • paper TuE5

XUV Circle Spectrometer for Line Profile Measurements

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Abstract

To design a high resolution stigmatic coma-free XUV spectrometer with symmetric instrumental profiles - allowing the use of deconvolution and modulation techniques, we have investigated in detail the performances of the Pouey-Circle-Spectrometer:1 a spherical holographic grating used at grazing incidence in convergent light (prefocusing toroidal mirror) could deliver spherical wavefronts (line spread function suffering only from spherical aberrations) if the object (virtual) and the image (real) are located on a circle centered on the tangent of the grating blank. Results obtained with the physical optic program will be compared to those derived by SHADOW2, an exact ray tracing program.

© 1986 Optical Society of America

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