Abstract

In these last years optical fiber communication requirements have arised considerable interest in materials for optical devices operating in the 1.3 - 1.6μm spectral region. Time resolved spectroscopy is a fundamental tool for studying such material responses. We report here a new method, Parametric Amplification Sampling Spectroscopy (PASS), for resolving weak near infrared emission with a subpicosecond accuracy. We have applied this scheme to measure the ultrashort luminescence lifetime of an infrared dye and electronic transport properties of multiple quantum well structures (MQWS).

© 1986 Optical Society of America