Abstract

We report a new technique to probe femtosecond dephasing processes in solids, requiring only low excitation intensities. The method is based on the measurement of the spontaneous emission spectrum of a thin sample (about 2µm) in front of a mirror, excited by 40 fs pulses from a colliding pulse modelocked (CPM) laser. Fig. 1A shows the simplified level scheme of a prototype molecule, and fig.1B gives the schematics of the experimental arrangement.

© 1990 Optical Society of America