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Conferences > UP > 2022 > W4A > W4A.19

Extracting the linear terahertz properties of thin films using complementary transmission and reflection measurements: Applied to GeSn thin films

B. N. Carnio, A. Attiaoui, S. Assali, O. Moutanabbir, and A. Y. Elezzabi

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Abstract

Complementary reflection and transmission measurements are used in conjunction with a Fresnel-based modeling approach to determine the refractive index and extinction coefficient of thin film layers, despite no prior knowledge of the substrate’s extinction coefficient.

© 2022 The Author(s)

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