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Mg ion implantation and post-annealing effect on the photoelectrical performance of a β-Ga2O3 photodetector

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Abstract

The effects of magnesium ion implantation and post-annealing on the photoelectric performance of a $\beta {\text -} {{\rm Ga}_2}{{\rm O}_3}$-based vertical structural Schottky photodetector (PD) were thoroughly investigated. After implantation and post-annealing, the Schottky barrier height and bandgap of the ${{\rm Ga}_2}{{\rm O}_3}$ surface can be slightly increased, while the dark current is significantly reduced, and the light-to-dark current ratio is immensely improved. The PD exhibited a photo-to-dark current ratio of 1733, responsivity of 5.04 mA/W, and specific detectivity of ${3.979} \times {{10}^{11}}$ Jones under ${-}{2.6}\;{\rm V}$ bias, and the rise and decay times are 0.157 were 0.048 s, respectively. The large left shift of the open-circuit voltage is feasibly explained by applying the thermionic-emission diffusion theory.

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Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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