Abstract
Ellipsometry is a powerful and well-established optical technique
used in the characterization of materials. It works by combining the
components of elliptically polarized light in order to draw information
about the optical system. We propose an ellipsometric experimental set-up
to study polarization interference in the total internal reflection regime
for Gaussian laser beams. The relative phase between orthogonal states can
be measured as a power oscillation of the optical beam transmitted through
a dielectric block, and the orthogonal components are then mixed by a
polarizer. We show under which conditions the plane wave analysis is
valid, and when the power oscillation can be optimized to reproduce a full
pattern of oscillation and to simulate quarter- and half-wave
plates.
© 2018 Chinese Laser Press
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