Abstract

A diffusion theory model induced by a line source distribution is presented for oblique-incidence reflectometry. By fitting to this asymmetric diffusion model, the absorption and reduced scattering coefficients <i>µ</i>_<i>a</i> and <i>µ</i>'_<i>s</i> of the turbid medium can both be determined with accuracy of 10% from the absolute profile of the diffuse reflectance in the incident plane at the negative position -1.5 transport mean free path (mfp') away from the incident point; particularly, <i>µ</i>'_<i>s</i> can be estimated from the data at positive positions within 0-1.0 mfp' with 10% accuracy. The method is verified by Monte Carlo simulations and experimentally tested on a phantom.

© 2011 Chinese Optics Letters

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