Abstract

An onboard functional monitoring device based on a pulsed infrared radiation source for periodically checking the photoelectric characteristics of the through path of optoelectronic observation devices was developed. The results of our experimental studies on this device as part of a scanning optoelectronic device with a large-format multi-element photodetector operating in the time-delay and accumulation mode are presented.

© 2019 Optical Society of America

Use of Laser Radiation in the Calibration of Spectrometer Scanning Functions*

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