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Multilayered analog optical differentiating device: performance analysis on structural parameters

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Abstract

Analogy optical devices (AODs) able to do mathematical computations have recently gained strong research interest for their potential applications as accelerating hardware in traditional electronic computers. The performance of these wavefront-processing devices is primarily decided by the accuracy of the angular spectral engineering. In this Letter, we show that the multilayer technique could be a promising method to flexibly design AODs according to the input wavefront conditions. As examples, various Si-SiO2-based multilayer films are designed that can precisely perform the second-order differentiation for the input wavefronts of different Fourier spectrum widths. The minimum number and thickness uncertainty of sublayers for the device performance are discussed. A technique by rescaling the Fourier spectrum intensity has been proposed in order to further improve the practical feasibility. These results are thought to be instrumental for the development of AODs.

© 2017 Optical Society of America

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Supplementary Material (2)

NameDescription
Data File 1       The sublayer thicknesses of the optimized multilayer systems.
Data File 2       The detailed thickness distribution for the different range of theta.

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