Abstract

The knowledge of variations in the reflectance in terms of the optical thickness in an all-dielectric multilayer coating simplifies the design and fabrication of a given optical device using thin film techniques. This variation has been defined as stability /1/ and has been demostrated to be inversely proportional to the partial derivative of the reflectance with respect to the phase change (∂R/∂ψ) or when this quantity vanishes, it is inversely proportional to the second derivative (∂²R/∂ψ²), following a second order development.

© 1992 Optical Society of America