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Nonlinear refractive index and multiphoton absorption measurements of wide bandgap semiconductors materials by femtosecond z-scan method

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Abstract

We studied the nonlinear properties of some of the most promising nonlinear media for microelectronic applications - AlN and GaN. The nonlinear refractive index n2 and the multiphoton absorption ß of the media are measured by femtosecond z-scan method with virtual aperture.

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Improved Z-scan techniques for ultrasensitive measurements of nonlinear refraction and absorption

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