Abstract
In the last few years several research groups have reported the development of optical scanning tunneling microscopes.1 In such devices total reflection occurs within the sample. Transmitted light is collected through a scanning thin optical fiber. Resolution of the order of 5-50 nm is achieved along the three axes; however, the sample has to be transparent and cannot have steep surfaces to avoid light leakage (no longer total reflection). The interpretation of the images is not easy.
© 1992 Optical Society of America
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