Abstract

We have developed the hardware and software for acquiring and analyzing both diagonal and off-diagonal elements of the complex optical dielectric function $\widetilde{ϵ}$ (equivalently the complex index of refraction, Kerr ellipticity, and Kerr rotation angles) as a function of wavelength from 300 to 900 nm. Hysteresis loops to ±10 kOe over the entire spectral range can be determined, and temperatures can be varied as well.

© 1988 Optical Society of America