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Deuterium plasma reduction of the free-carrier level in GaAs for optical waveguides

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Abstract

Exposure of bulk GaAs (either n- or p-type) to a hydrogen or a deuterium plasma can be used to passivate the sample surface, thereby reducing the free-carrier concentration. This in turn will modify both the refractive index and the free-carrier absorption, thereby making the samples suitable for optical waveguides.

© 1990 Optical Society of America

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