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Conferences > OIC > 1988 > WC > WC10

Determination of the refractive index and thickness of a thin film embedded into a given stratified medium

G. Chabrier, J.P. Goudonnet, and P. Vernier

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Abstract

A thin film embedded into a known stratified medium can be characterized by non destructive optical measurements. Transmittance and reflectance can be easily measured with s and p polarizations and several incidence angles. Light can enter into the medium through a prism or a cylinder in order to extend the usable incidence angles and fulfil attenuated total reflection (ATR) conditions.

© 1988 Optical Society of America

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