Abstract

One of the major problems that has been plaguing the optical and materials engineers in the effective utilization of thin films in a variety of optical devices, is that even the basic data on the true refractive index, and its dispersion of many materials have not yet been determined since they are not available in bulk form and in thin film form they are inhomogeneous with consequent irreproducible results. Borgogno et al. [1] have recently developed a method of determining the complex refractive index, the thickness and the magnitude of film inhomogeneity from an analysis of normal incidence spectral reflectance and transmittance results with the assumption that the refractive index of the film decreases (or increases) linearly with thickness due to inhomogeneity. Such an assumption is however seldom valid.

© 1988 Optical Society of America