Abstract

Previous works [1] have shown how to use both guided waves and photothermal technique to provide a powerful characterization tool of losses in single thin film layers. In this continuation of the work, we use complementary techniques to assess our understanding of the phenomena in single layers, in particular about the relative amount of surface and bulk scattering in the waveguide. Moreover, new results are presented and concern the relative absorption of different materials inside the same multilayer stack.

© 1992 Optical Society of America