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Conferences > PXRAYMS > 1992 > MC > MC3

Diffusion Behavior of Metal-Carbon Multilayers

A.D. Akhsakhalyan, A.A. Fraerman, Yu. Ya. Platonov, N.I. Polushkin, and N.N. Salashchenko

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Abstract

The effect of annealing on the X-ray optical characteristics of artificial multilayer structures composed of metal (Cr,Fe,Ni,Mo,Rh, W,Pt and others) and carbon is studied. To analyze the changes at annealing a small-angle X-ray diffraction was used. The observed X-ray reflectivity enhancement can be explained by the uphill diffusion of metal atoms.

© 1992 Optical Society of America

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