Abstract
We briefly report the optoelectronic characteristics of Shottky-type Photodiode fabricated on the Silicon-implanted Borosilicate glass (SiO2:Si+) - a novel nano-crystallite Si semi-conducting material. The dark current, photocurrent and breakdown voltage of the SiO2:Si+ photodiode illuminated by Ar+ laser are measured. The effect of annealing time on the semi-conducting property of such material is characterized.
© 2001 IEEE
PDF ArticleMore Like This
K.V. Shcheglov, C.M. Yang, and H.A. Atwater
MSaB3 Microphysics of Surfaces: Nanoscale Processing (MSNP) 1995
Necmi Biyikli, Ibrahim Kimukin, Ekmel Ozbay, Mutlu Gokkavas, and Selim Unlu
UFA4 Ultrafast Electronics and Optoelectronics (UEO) 2001
Y. Jiang, P.T. Wilson, M.C. Downer, C.W. White, and S.P. Withrow
CFB6 Conference on Lasers and Electro-Optics (CLEO:S&I) 2001