Fast and Sensitive THz Detection by an Asymmetric-Dual-Grating-Gate Epitaxial-Graphene-Channel FET Due to Plasmonic and Photothermoelectric Rectification Effects

Koichi Tamura; Chao Tang; Daichi Ogiura; Kento Suwa; Hirokazu Fukidome; Yuma Takida; Hiroaki Minamide; Tetsuya Suemitsu; Taiichi Otsuji; Akira Satou

doi:10.1364/CLEO_SI.2023.SF1I.3

CLEO 2023
Technical Digest Series (Optica Publishing Group, 2023),
paper SF1I.3
•https://doi.org/10.1364/CLEO_SI.2023.SF1I.3

Fast and Sensitive THz Detection by an Asymmetric-Dual-Grating-Gate Epitaxial-Graphene-Channel FET Due to Plasmonic and Photothermoelectric Rectification Effects

Koichi Tamura, Chao Tang, Daichi Ogiura, Kento Suwa, Hirokazu Fukidome, Yuma Takida, Hiroaki Minamide, Tetsuya Suemitsu, Taiichi Otsuji, and Akira Satou

CLEO: Science and Innovations 2023

San Jose, CA United States
7–12 May 2023
ISBN: 978-1-957171-25-8

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THz Detection and Spectroscopy (SF1I)

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K. Tamura, C. Tang, D. Ogiura, K. Suwa, H. Fukidome, Y. Takida, H. Minamide, T. Suemitsu, T. Otsuji, and A. Satou, "Fast and Sensitive THz Detection by an Asymmetric-Dual-Grating-Gate Epitaxial-Graphene-Channel FET Due to Plasmonic and Photothermoelectric Rectification Effects," in CLEO 2023, Technical Digest Series (Optica Publishing Group, 2023), paper SF1I.3.

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Abstract

We experimentally investigate an epitaxial-graphene-channel FET THz detector demonstrated a 10-ps-order fast response time and a high responsivity of 0.3 mA/W at room temperature. We also identify coexisting of both plasmonic and photothermoelectric rectification effects.

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