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Optica Publishing Group
  • First Optoelectronics and Communications Conference
  • Technical Digest Series (Optica Publishing Group, 1996),
  • paper 18D3.3

Arsenic-Free Thermal Surface Cleaning for Molecular-Beam-Epitaxy and its Application to Fabrication of InGaAs/InGaP DFB Laser

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Abstract

A novel arsenic-free thermal cleaning method combined with gas-source molecular- beam-epitaxy (GS-MBE) is proposed for reducing dislocations and organic impurities accumulated at GaAs regrown interface. By using this method, 0.98 µm InGaAs/InGaP DFB laser was successfully fabricated for the first time by GS-MBE.

© 1996 IEICE

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