Abstract
We will present a new approach of linearized focal plane technique (LIFT), formerly developed by ONERA, which results in an improvement of a factor of 16 (4x4) of the spatial resolution. This technology is based on the combination of standard SH technology with phase retrieval algorithms applied on all spots of the microlens array that provides information on high spatial frequencies. We will show some measurements performed on extremely complex wavefronts. This technology presents very promising perspectives for optical and freeform metrology and can advantageously replace, at lower cost and better usability, Fizeau interferometry.
© 2023 The Author(s)
PDF ArticleMore Like This
J Qiao, Z. Mulhollan, and C. Dorrer
FW5H.5 Frontiers in Optics (FiO) 2016
B. R. Swain, C. Dorrer, S. DeFisher, and J. Qiao
OF4B.6 Adaptive Optics: Analysis, Methods & Systems (AO) 2020
Biswa Ranjan Swain, Christophe Dorrer, and Jie Qiao
OM3B.4 Optical Fabrication and Testing (OF&T) 2021