The Theoretical Models of the Relationship Between N and P for the Thin Films

Xue-Ren Wang; Jiu-Lin Zhou

doi:10.1364/OIC.1988.WC4

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1988),
paper WC4
•https://doi.org/10.1364/OIC.1988.WC4

The Theoretical Models of the Relationship Between N and P for the Thin Films

Xue-Ren Wang and Jiu-Lin Zhou

Optical Interference Coatings 1988

Tucson, Arizona United States
12–15 April 1988
ISBN:

From the session
Optical Properties of Thin Films: 2 (WC)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
X. Wang and J. Zhou, "The Theoretical Models of the Relationship Between N and P for the Thin Films," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1988), paper WC4.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

Recently measurements of refractive index of the thin films as a function of packing density have been made at the CSIRO Division of Applied Physics on Ce0₂ and Zr0₂ films produced by ion-assisted deposition. We used the Stoner model to fit the experimental data for Ce0₂ and Zr0₂ films. Ce0₂ films should be considered as absorbing moisture even under vacuum. Zr0₂ films, are more complicated, with three regions of packing density each with appropriate column and void characteristics.

PDF Article

More Like This

Film Microstructure and its Effects on Optical Coatings

Ian Hodgkinson
TuA2 Optical Interference Coatings (OIC) 1988

In-Situ Ellipsometric Monitoring and Modelling of the Growth and Synthesis of Thin Films

R.P. Netterfield, P.J. Martin, K.-H. Müller, W.G. Sainty, C.G. Pacey, and S.W. Filipczuk
TuC1 Optical Interference Coatings (OIC) 1988

Effect of IAD on Trnsition Properties of Vanadium Dioxide Thin Films

Han Liying and Gao Jiancun
ThB14 Optical Interference Coatings (OIC) 1988

Previous Article Next Article