Characterization of Dynamic Indices by Stimulated Spectroscopic Ellipsometry

Jin Gang; J.P. Roger; A.C. Boccara; J.L. Stehle; J.L. Stehle

doi:10.1364/OIC.1992.OThE4

Optical Interference Coatings
Technical Digest Series (Optica Publishing Group, 1992),
paper OThE4
•https://doi.org/10.1364/OIC.1992.OThE4

Characterization of Dynamic Indices by Stimulated Spectroscopic Ellipsometry

Jin Gang, J.P. Roger, A.C. Boccara, and J.L. Stehle

Optical Interference Coatings 1992

Tucson, Arizona United States
1–5 June 1992
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Ellipsometry (OThE)

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J. Gang, J. P. Roger, A. C. Boccara, and J. L. Stehle, "Characterization of Dynamic Indices by Stimulated Spectroscopic Ellipsometry," in Optical Interference Coatings, Technical Digest Series (Optica Publishing Group, 1992), paper OThE4.

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Abstract

Dynamic indices of multilayer structures can be extracted from stimulated spectroscopic ellipsometry. Using pulsed laser excitation, various heat diffusion processes through the structure can be separated.

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