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Conferences > OIC > 1992 > OThE > OThE7

Surface Plasmon Measurements of In2O3:Sn Thin Films

J. P. Lehan and R. W. Sprague

Open Access Open Access

Abstract

We have applied a He-Ne laser operating at 3.39 microns to probe the microstructure of thin films of In2O3:Sn by observing their surface plasmon characteristics. The results of the surface plasmon measurements will be contrasted with theoretical results calculated using the Drude model from measured DC electrical properties. Discrepancies between theory and experiment will be explained in terms of film microstructure.

© 1992 Optical Society of America

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