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Conferences > OIC > 1992 > OThE > OThE6

In-situ characterization by spectroscopic ellipsometry and photoemission of CaF2 films grown by molecular beam deposition in ultra-high vacuum

J. Rivory, S. Fisson, V. Van Nguyen, G. Vuye, Y. Wang, F. Abeles, and K. Yu-Zhang

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Abstract

As previously mentionned [1], ultra high vacuum conditions and molecular beam deposition bring significant improvements in the stability of optical thin films and allow to benefit of in situ surface analysis techniques.

© 1992 Optical Society of America

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