Abstract

X-ray interference mirrors are a particular case of artificial multilayered media for which the wanted property is a high intensity of the diffraction phenomena itself. For such applications one needs to know the performance of the mirrors at different wavelengths. We would like to demonstrate here how such X-ray reflectivity tests can be achieved on a laboratory apparatus to get absolute reflectivity and without the need of a synchrotron source.

© 1992 Optical Society of America