Abstract
SPLAT has been useful in exploring the deviations of optimal image quality from that of limits of diffraction limited optics in projection x-ray lithography proto-type systems. This was accomplished through modifying the aberration options in SPLAT to accept detailed optical system wavefront data from CodeV. This allows feedback from the as built and as coated soft x-ray elements on the resulting imaged quality.
© 1993 Optical Society of America
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