47 papers in 9 sessions Change year:

A Simplified Description of Light Scattered by an Optical Coating

JWA1 Surface Roughness and Scattering (SURS) 1992 View: PDF

Teflon Laps: Some New Developments and Results

JWA2 Surface Roughness and Scattering (SURS) 1992 View: PDF

Comparison of Vector Scattering Theory and BRDF Measurements on a Thick Silica Overcoated Aluminized Substrate

JWA3 Surface Roughness and Scattering (SURS) 1992 View: PDF

Progress toward objective measurement of surface damage

JWA4 Surface Roughness and Scattering (SURS) 1992 View: PDF

Optical scattering and microstructure of gold and platinum coatings

JWA5 Surface Roughness and Scattering (SURS) 1992 View: PDF

An experimental equipment for studying the whole space scattering from microrough surfaces

JWA6 Surface Roughness and Scattering (SURS) 1992 View: PDF

Relations between Light Scattering and Microstructure of Optical Thin Films

JWB1 Surface Roughness and Scattering (SURS) 1992 View: PDF

From light scattering to the microstructure of thin film multilayers

JWB2 Surface Roughness and Scattering (SURS) 1992 View: PDF

Optical Scatter Characteristics of Multilayer Dielectric Mirrors

JWB3 Surface Roughness and Scattering (SURS) 1992 View: PDF

Observation of Rayleigh Scattering from Multilayer Dielectric Thin Films

JWB4 Surface Roughness and Scattering (SURS) 1992 View: PDF

Correlation Between Substrate Preparation Technique and Scatter Observed from Optical Coatings

JWB5 Surface Roughness and Scattering (SURS) 1992 View: PDF

A multiwavelength angle-resolved scatterometer or how to extend the optical window

JWB7 Surface Roughness and Scattering (SURS) 1992 View: PDF

Comparison of surface and bulk scattering in optical coatings

JWB8 Surface Roughness and Scattering (SURS) 1992 View: PDF

A Status Report on the Development of International Standards for Optical Coatings

JWC1 Surface Roughness and Scattering (SURS) 1992 View: PDF

Stabilization of the Optical Properties of Thin Film Systems

JWC2 Surface Roughness and Scattering (SURS) 1992 View: PDF

In-Situ Measurements of the Stability of Conventionally Evaporated and Ion-Assisted Deposited Narrowband Filters

JWC3 Surface Roughness and Scattering (SURS) 1992 View: PDF

Enhanced Long Range Correlations of Light Reflected from Random Rough Surfaces

PD1 Surface Roughness and Scattering (SURS) 1992 View: PDF

Light Scatter from Polysilicon Surfaces and Comparison with Surface Roughness Statistics by AFM*

PD2 Surface Roughness and Scattering (SURS) 1992 View: PDF

Light Scattering by Sub-Half Micron Spherical Particles on Silicon and Oxide/Silicon Surfaces*

PD3 Surface Roughness and Scattering (SURS) 1992 View: PDF

Specification of surface finish in terms of system performance

SMA1 Surface Roughness and Scattering (SURS) 1992 View: PDF

Interaction of Two Optical Beams At a Symmetric Random Surface

SMA2 Surface Roughness and Scattering (SURS) 1992 View: PDF

Mueller matrix description of scattering

SMA3 Surface Roughness and Scattering (SURS) 1992 View: PDF

Analytical vs. Numerical Methods for Rough Surface Scattering

SMA4 Surface Roughness and Scattering (SURS) 1992 View: PDF

Exact calculations of surface impedance for periodic rough surfaces

SMA5 Surface Roughness and Scattering (SURS) 1992 View: PDF

Scattering of Electromagnetic Surface Waves by Rough Surfaces

SMA6 Surface Roughness and Scattering (SURS) 1992 View: PDF

X-Ray scattering from grazing incidence telescopes

SMB1 Surface Roughness and Scattering (SURS) 1992 View: PDF

Surface Measurements and Frequency Analysis

SMB2 Surface Roughness and Scattering (SURS) 1992 View: PDF

Regimes of Surface Roughness Measurable with Light Scattering

SMB3 Surface Roughness and Scattering (SURS) 1992 View: PDF

Comparison between laser stylus and contact stylus measurements on rough surfaces

SMB4 Surface Roughness and Scattering (SURS) 1992 View: PDF

Applications of Light Scatter for Microelectronics Manufacturing

SMC1 Surface Roughness and Scattering (SURS) 1992 View: PDF

Preparing Samples for Scattering Measurements - A Cleaning Study

SMC2 Surface Roughness and Scattering (SURS) 1992 View: PDF

Oxidation Stacking Faults (OSFs) in Silicon Crystals Detected by Light Scattering Topography

SMC3 Surface Roughness and Scattering (SURS) 1992 View: PDF

Perturbation Theory of the Enhanced Backscattering of Light From Weakly Rough Random Metal Surfaces

STuA1 Surface Roughness and Scattering (SURS) 1992 View: PDF

Experimental Measurements of Enhanced Backscattering and Related Effects from Randomly Rough Surfaces

STuA2 Surface Roughness and Scattering (SURS) 1992 View: PDF

Light Scattering from Photofabricated Surfaces with non-Gaussian Statistical Properties

STuA3 Surface Roughness and Scattering (SURS) 1992 View: PDF

Wavelength and Angular Dependence of Light Scattering From Beryllium: Comparison of Theory and Experiment

STuA4 Surface Roughness and Scattering (SURS) 1992 View: PDF

Theoretical and experimental comparison of different techniques to characterize surface roughness

STuA5 Surface Roughness and Scattering (SURS) 1992 View: PDF

The Use of Reflectivity Measurements in Phase Shifting Interferometry in Surface Profiles

STuA6 Surface Roughness and Scattering (SURS) 1992 View: PDF

Is The Opposition Effect of Saturn’s Rings Caused by Coherent Backscattering?

STuA7 Surface Roughness and Scattering (SURS) 1992 View: PDF

"Ultrasonic Measurements of Surface Roughness"

STuB1 Surface Roughness and Scattering (SURS) 1992 View: PDF

An Interferometric Profiler for Rough Surfaces

STuB2 Surface Roughness and Scattering (SURS) 1992 View: PDF

Integrating Figure and Finish Measurements with Surface Profiling Instruments

STuB3 Surface Roughness and Scattering (SURS) 1992 View: PDF

Recent Developments in Profiling Optical Surfaces

STuB4 Surface Roughness and Scattering (SURS) 1992 View: PDF

Very Near Specular Scatter Measurements

STuB5 Surface Roughness and Scattering (SURS) 1992 View: PDF

Design Review of a Unique Out-Of-Plane Polarimetric Scatterometer

STuB6 Surface Roughness and Scattering (SURS) 1992 View: PDF

Determination of Interface Roughness Using A Wavelength Scanning TIS Instrument

STuB7 Surface Roughness and Scattering (SURS) 1992 View: PDF